NSN Information for Part Number CD4011BE with NSN 5962-01-282-3059, 5962012823059
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-282-3059 Item Description: MICROCIRCUIT,DIGITAL | 5962 | 012823059 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| CD4011BE | 3 | 1 | 5 |
Characteristics Data of NSN 5962-01-282-3059, 5962012823059
| MRC | Criteria | Characteristic |
|---|---|---|
| ABKW | OVERALL HEIGHT | 0.275 INCHES NOMINAL" |
| ADAQ | BODY LENGTH | 0.770 INCHES UM" |
| ADAT | BODY WIDTH | 0.245 INCHES MINIMUM AND 0.255 INCHES UM" |
| ADAU | BODY HEIGHT | 0.125 INCHES MINIMUM AND 0.135 INCHES UM" |
| AEHX | UM POWER DISSIPATION RATING | 500.0 MILLIWATTS" |
| AFGA | OPERATING TEMP RANGE | -40.0/+85.0 DEG CELSIUS" |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS" |
| CBBL | FEATURES PROVIDED | W/BUFFERED OUTPUT AND MONOLITHIC AND POSITIVE OUTPUTS" |
| CQSJ | INCLOSURE MATERIAL | PLASTIC" |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE" |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC" |
| CQZP | INPUT CIRCUIT PATTERN | QUAD 2 INPUT" |
| CSSL | DESIGN FUNCTION AND QUANTITY | 4 GATE, NAND BUFFER" |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER" |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS UM POWER SOURCE" |
| CZEQ | TIME RATING PER CHACTERISTIC | 250.00 NANOSECONDS UM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 250.00 NANOSECONDS UM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT" |
| TTQY | TERMINAL TYPE AND QUANTITY | 14 PRINTED CIRCUIT" |
| ABKW | OVERALL HEIGHT | 0.275 INCHES NOMINAL" |
| ADAQ | BODY LENGTH | 0.770 INCHES UM" |
| ADAT | BODY WIDTH | 0.245 INCHES MINIMUM AND 0.255 INCHES UM" |
| ADAU | BODY HEIGHT | 0.125 INCHES MINIMUM AND 0.135 INCHES UM" |
| AEHX | UM POWER DISSIPATION RATING | 500.0 MILLIWATTS" |
| AFGA | OPERATING TEMP RANGE | -40.0/+85.0 DEG CELSIUS" |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS" |
| CBBL | FEATURES PROVIDED | W/BUFFERED OUTPUT AND MONOLITHIC AND POSITIVE OUTPUTS" |
| CQSJ | INCLOSURE MATERIAL | PLASTIC" |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE" |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC" |
| CQZP | INPUT CIRCUIT PATTERN | QUAD 2 INPUT" |
| CSSL | DESIGN FUNCTION AND QUANTITY | 4 GATE, NAND BUFFER" |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER" |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS UM POWER SOURCE" |
| CZEQ | TIME RATING PER CHACTERISTIC | 250.00 NANOSECONDS UM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 250.00 NANOSECONDS UM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT" |
| TTQY | TERMINAL TYPE AND QUANTITY | 14 PRINTED CIRCUIT" |
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